【24h】

Simulation of debris-induced lift-off in MFL testing

机译:在MFL测试中模拟碎屑引起的剥离

获取原文
获取原文并翻译 | 示例

摘要

The results of the testing have shown that debris-induced lift-off, in all its forms, has a detrimental effect on the acquired MFL data. Since there is no reliable and accurate way to determine that lift-off has occurred, it will always be a potential problem. Deeper, wider, and axially aligned slot defects appear to experience the greatest reduction in peak MFL amplitude when under the effect of debris-induced lift-off. This will result in severely underestimated or missed defects. The data indicates that it is very easy for smaller defects to be totally missed. Perhaps the most interesting observation is that a large percentage of the signal degradation occurs in the first 0.125 inch of lift-off. This observation highlights the importance of pre-inspection pipeline cleaning. This essentially indicates that low levels of sensor lift-off and simultaneous sensor and magnetizer lift-off produce significant degradation in the acquired MFL data. If pipeline defects are located in an area where lift-off has occurred, the potential is much higher for them to be missed or underestimated.
机译:测试结果表明,各种形式的碎屑引起的剥离对获取的MFL数据有不利影响。由于没有可靠且准确的方法来确定是否发生了升空,因此这始终是一个潜在的问题。在由碎屑引起的剥离作用下,更深,更宽且轴向对齐的缝隙缺陷似乎会出现最大MFL振幅降低最大的情况。这将导致严重低估或遗漏的缺陷。数据表明,完全消除较小的缺陷非常容易。也许最有趣的观察是,信号衰减的很大一部分发生在提起的第一个0.125英寸处。该观察结果突出了检查前管道清洁的重要性。这实质上表明,传感器提离的水平较低,同时传感器和磁化器提离的水平较低,会导致所获取的MFL数据明显下降。如果管道缺陷位于发生剥离的区域,那么遗漏或低估的可能性就更大。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号