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Radiography Testing with Flat Panel Type Image Detector

机译：平板型图像检测仪的射线照相测试

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摘要

The performances of a new type of imaging device, "Flat Panel Detector", has beenstudied. An amorphous Si imaging device with a wide active area and a thinthickness of the dimension has been prepared. The perfomance of the device arestudied. The characteristics of phosphor scintillation screens used for the devicehave been tested. Various applications of the device for NDT are investigated. Ithas been cleared that the device has fairly high spatial resolution, highsensitivity and high dynamic range for usual x-ray testing. Especially, the imagequality of the device has been very high. The devices are more sensitive than usualindustrial x-ray films, and have the performance of nearly real-time radiography.By considering these aspects, the devices are more important in future radiography.
机译：新型成像设备“平板探测器”的性能已经达到 研究过。具有宽的有源区和薄的非晶硅成像器件 尺寸的厚度已准备好。该设备的性能是 研究过。用于设备的荧光粉闪烁屏的特性 已经过测试。研究了无损检测设备的各种应用。它 已清除该设备具有相当高的空间分辨率， 灵敏度和高动态范围，适用于常规X射线测试。特别是图像 设备的质量一直很高。设备比平常更敏感 工业X射线胶片，并具有近乎实时的X射线照相性能。 通过考虑这些方面，这些设备在未来的射线照相术中更为重要。

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