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Thermal Property Measurements of Giant Magnetoresistive (GMR) Layers

机译:巨磁阻(GMR)层的热性能测量

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摘要

A novel technique has been proposed for the measurement of in-plane thermal conductivity of the thin-film superlattice structure in the GMR head for data storage systems. Different from the suspended structures which need complicated fabrication process, the film is simply deposited on a silicon dioxide layer of thickness near 1 micron which acts as a thermal barrier, forcing the heat diffuse laterally along the film before it reaches the substrate. The maximum measurement sensitivity could be achieved through the optimized geometric design of the structure from the sensitivity analysis.
机译:已经提出了用于测量数据存储系统的GMR头中的薄膜超晶格结构的面内热导率的新技术。与需要复杂制造过程的悬挂结构不同,该膜仅沉积在厚度接近1微米的二氧化硅层上,该二氧化硅层可作为热障,迫使热量在到达基板之前沿膜横向扩散。通过灵敏度分析的结构优化几何设计可以实现最大的测量灵敏度。

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