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SN-SOR:Single-Node SOR Method for Statistic Analysis of Power/Ground Networks

机译:SN-SOR:电力/地面网络统计分析的单节点SOR方法

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With IC technology scaling into nanometer regime,VLSI chips not only become much more complex but also suffer from visible process variations. As a result,statistical methods are replacing deterministic methods for power/ground (P/G) grid analysis and efficient local analysis methods are badly needed to cut down the analysis complexity. A novel single-node successive over relaxation (SN-SOR) analytical method is proposed to efficiently solve correlated resistor vectors and then directly compute voltage variations for question nodes of large IR drop. Compared with traditional global SOR methods,SN-SOR method shows visible advantages including locality,efficiency,and low memory complexity. Experiments show our method is average 30 times faster than the global SOR method with only 0.38% accuracy loss.
机译:随着IC技术扩展到纳米技术领域,VLSI芯片不仅变得更加复杂,而且还面临明显的工艺变化。结果,统计方法正在取代用于电源/地面(P / G)网格分析的确定性方法,并且迫切需要有效的局部分析方法来降低分析的复杂性。提出了一种新颖的单节点连续过弛(SN-SOR)分析方法,以有效地求解相关的电阻矢量,然后直接计算出IR下降较大的问题节点的电压变化。与传统的全局SOR方法相比,SN-SOR方法具有明显的优势,包括局部性,效率高,内存复杂度低。实验表明,我们的方法平均比全局SOR方法快30倍,而准确度损失仅为0.38%。

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