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Comparisons of noise spectroscopy analyze and microplasma noise sources

机译:噪声光谱分析与微等离子体噪声源的比较

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As it was the mechanical noise used for diagnostic of machine in the past, the electronic noise can be used as diagnostic tool for detection defects in electronical devices and systems in the future. This paper deals with comparisons of noise spectroscopy and detection of microplasma noise sources in the three new type of solar cells G1, G3 and G5. When high electric is applied to PN junction with some technological imperfections like dislocation in PN junction or crystal-grid defect causing non-homogeneity of parameters it produces in tiny areas of enhanced impact ionization called microplasma. It can leads onwards to deterioration in quality or to destruction of PN junction. Microplasma produced noise, which has random spectrum in frequency range. Microplasma noise is measurable even before the creation of light emissions. Due to the comparisons microplasma detection with noise characteristic can full analyzed solar cell.
机译:由于过去是用于机器诊断的机械噪声,因此将来电子噪声可以用作检测电子设备和系统中缺陷的诊断工具。本文讨论了三种新型太阳能电池G1,G3和G5中的噪声光谱比较和微等离子体噪声源的检测。当将高电应用于某些具有技术缺陷的PN结时,例如PN结中的位错或晶格缺陷导致参数不均匀,它会在称为微等离子体的增强碰撞电离的微小区域中产生。否则可能导致质量下降或PN结损坏。微等离子体产生的噪声在频率范围内具有随机频谱。即使在产生光发射之前,微等离子体噪声也是可以测量的。由于比较,具有噪声特性的微等离子体检测可以完全分析太阳能电池。

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