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Functional OBIRCH strategy in analyzing complex functional failures including logic failures

机译:用于分析复杂功能故障(包括逻辑故障)的功能OBIRCH策略

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OBIRCH (Optical Beam Induced Resistance Change) analysis was usually used to analyze direct leakage or short failure. But when met complex functional failures, we only know the leakage existed and higher current was consumed, but we couldn't confirm the leakage path or which device was the main failed one. An efficient method was presented by performing OBIRCH analysis in function mode with different kinds of setup condition to trace the abnormal current. It could detect the current path and indicate the failed device directly without much microprobe work. It was also helpful in analyzing the logic failures without test pattern.
机译:OBIRCH(光束感应电阻变化)分析通常用于分析直接泄漏或短路故障。但是当遇到复杂的功能故障时,我们只知道泄漏存在并且消耗了更大的电流,但是我们无法确定泄漏路径或哪个设备是主要的故障。通过在功能模式下以不同的设置条件执行OBIRCH分析以追踪异常电流,提出了一种有效的方法。它可以检测当前路径并直接指示发生故障的设备,而无需进行大量的微探针工作。在没有测试模式的情况下分析逻辑故障也很有帮助。

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