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首页> 外文会议>2013 Proceedings - Annual Reliability and Maintainability Symposium >Characteristic instantaneous relevant reversible failures and reliability of modern mass-produced electronics
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Characteristic instantaneous relevant reversible failures and reliability of modern mass-produced electronics

机译：现代量产电子产品的特性瞬时相关可逆故障和可靠性

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摘要

Typical instantaneous relevant reversible failures (IRRF) of modern electronics and their role are defined and classified. Characteristic prevalent IRRF are exemplified and analyzed across technologies and applications. Matching interactions of parametric shifts and anomalies, imbalanced tight tolerance and low resilience system under complex stresses are shown to cause most characteristic IRRF. Their relation with project-relevant features, functions, factors and faults are discussed, as are their links with isentropic phenomena. Systemic early failure analysis (FA) is again shown to be a vital part of modern responsible and profitable quality and reliability assurance. Practical recommendations resulted in concurrent improvement of customer satisfaction and yield, as well as facilitation of operations and R&D.
机译：对现代电子设备的典型瞬时相关可逆故障（IRRF）及其作用进行了定义和分类。跨技术和应用对典型的流行IRRF进行了示例和分析。结果表明，在复杂的应力作用下，参数变化和异常，不严格的紧公差和低回弹系统的匹配相互作用会导致IRRF的特征性增加。讨论了它们与项目相关的特征，功能，因素和故障的关系，以及它们与等熵现象的联系。系统的早期故障分析（FA）再次被证明是现代负责任的，可盈利的质量和可靠性保证的重要组成部分。实用的建议可同时提高客户满意度和产量，并促进运营和研发。

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