Active millimeter wave radar system for non-destructive, non-invasive underline fault detection and multilayer material analysis

著录项

• 来源
  《2014 IEEE MTT-S International Microwave and RF Conference, Collocated with Intemational Symposium on Microwaves》|2014年|369-372|共4页
• 会议地点 Bangalore(IN)
• 作者

  Agarwal Smriti; Singh Dharmendra; Pathak Nagendra P.;

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• 作者单位

  Center of Nanotechnol., Indian Inst. of Technol. Roorkee, Roorkee, India;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  automatic optical inspection; condition monitoring; consumer products; crack detection; dielectric measurement; fault diagnosis; millimetre wave materials; millimetre wave measurement; millimetre wave radar; nondestructive testing; radar imaging; thickness measurement; MMW radar; V band; active millimeter wave radar system; automatic structural health monitoring; concealed crack detection; consumer product quality check; industry dispatch end; invisible cracks; multilayer material analysis; non-invasive underline fa;

  机译：自动光学检查;状态监测;消费品;裂缝检测;介电测量;故障诊断;毫米波材料;毫米波测量;毫米波雷达;无损检测;雷达成像;厚度测量; MMW雷达; V波段;有源毫米波雷达系统;结构健康自动监测;隐患检测;消费品质量检查;工业调度结束;隐患;多层材料分析;无创划线;