首页> 外文会议>2014 International Conference on Electrical Sciences and Technologies in Maghreb >Experimental study on the EMI and switching time evolution of IGBT devices after operating aging tests
【24h】

Experimental study on the EMI and switching time evolution of IGBT devices after operating aging tests

机译:老化测试后IGBT器件的EMI和开关时间演变的实验研究

获取原文
获取原文并翻译 | 示例

摘要

The IGBT is a critical device in the static converters, it is important to assess its reliability. In this paper, we investigate the accelerated aging effect on the conducted EMI (ElectroMagnetic Interferences) evolution in the N Chanel IGBTs. We propose a new aging method applied to the IGBT switching in the buck converter circuit (chopper series type), while applying a high current, in order to achieve a junction temperature (Tj) exceeds the highest maximum value specified by the manufacturer. The conducted EMI evolution is examined and presented before and after aging tests. The measurement results show that the obtained variations after aging tests are only on the conducted EMI amplitudes.
机译:IGBT是静态转换器中的关键设备,评估其可靠性非常重要。在本文中,我们研究了加速老化对N香奈儿IGBT中传导EMI(电磁干扰)演变的影响。我们提出了一种新的老化方法,该方法应用于降压转换器电路(斩波器串联型)中的IGBT开关,同时施加大电流,以使结温(Tj)超过制造商指定的最高最大值。在老化测试之前和之后检查并介绍传导的EMI演变。测量结果表明,老化测试后获得的变化仅取决于传导的EMI幅度。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号