首页> 外文会议>2014 Third Mediterranean Photonics Conference >Qualification and reliability standards for photonic component technologies
【24h】

Qualification and reliability standards for photonic component technologies

机译:光子组件技术的资格和可靠性标准

获取原文
获取原文并翻译 | 示例

摘要

From optoelectronics commercial systems through aerospace applications, new technologies based equipment must be designed taking into account reliability risks. Existing qualification standards and processes have been developed from field return “lessons learned”. The qualification methods have been built-up to take into account questions and concerns observed on previous well established processes. Is this approach applicable to new products and materials? How will new optoelectronic technologies, nanotechnologies, and new packaging techniques perform when tested under conditions defined in existing standards? Are the Aerospace and Military standards adequate to validate long term application and proof of reliability for the new devices? What is missing, and what is needed? Should we modify the methodology for qualifying new parts based on these innovative technologies? What is needed for implementing efficiently and just in time High Reliability application processes? Evolving methodology may be one solution but must be constructed based on results of experiments from FOAT (Failure Oriented Accelerated Testing) and QT (Qualification Testing) for new technologies. This presentation gives an overview of general issues of microelectronics when employed in harsh environments (electrical, optical, thermal, mechanical, radiation). Understanding the need, defining goals, accumulating field failure data, developing reliability models and educating our customers is a recommended approach to develop comprehensive FOAT and QT programs.
机译:从光电商业系统到航空航天应用,必须在设计基于新技术的设备时考虑到可靠性风险。现有的资格标准和流程是根据现场返回的“经验教训”制定的。已经建立了资格评定方法,以考虑到以前建立良好的过程中所观察到的问题和疑虑。这种方法是否适用于新产品和新材料?在现有标准中定义的条件下进行测试时,新的光电技术,纳米技术和新的封装技术将如何执行?航空航天和军事标准是否足以验证新设备的长期应用和可靠性?缺少什么,需要什么?我们是否应该基于这些创新技术修改用于鉴定新零件的方法?高效,及时地实施高可靠性应用程序需要什么?不断发展的方法论可能是一种解决方案,但必须基于FOAT(面向失败的加速测试)和QT(资格测试)针对新技术的实验结果来构建。本演讲概述了在恶劣环境(电,光,热,机械,辐射)中使用微电子学时的一般问题。建议的方法是:了解需求,定义目标,累积现场故障数据,开发可靠性模型并教育客户,这是开发全面的FOAT和QT程序的推荐方法。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号