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首页> 外文会议>2015 IEEE Student Symposium in Biomedical Engineering amp; Sciences >Assessment of near infrared LED radiation pattern using Otsu thresholding
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Assessment of near infrared LED radiation pattern using Otsu thresholding

机译：使用Otsu阈值评估近红外LED辐射方向图

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摘要

This paper describes the use of Otsu thresholding method in assessing the radiation pattern emitted by near infrared (NIR) LED. The NIR LED configured in this paper is intended to be used as illumination source for the development of a NIR palm vein image acquisition device. The experiment is conducted using a single board computer (SBC) to promote a real-time embedded system development that can be readily integrated as a vein viewing device. Based on the Otsu thresholded image obtained, it is observed that the NIR LED radiation pattern can be accessed subjectively through the thresholding process. The resulted thresholded image can be used as preliminary assessment of the radiation pattern in developing a NIR image acquisition system that fully utilizes the NIR LED properties.
机译：本文介绍了Otsu阈值法在评估近红外（NIR）LED发射的辐射方向图中的用途。本文配置的NIR LED旨在用作NIR掌静脉图像采集设备开发的照明源。该实验使用单板计算机（SBC）进行，以促进实时嵌入式系统的开发，该系统可以轻松集成为静脉查看设备。基于获得的大津阈值图像，可以观察到通过阈值处理可以主观地访问NIR LED辐射图。在开发充分利用NIR LED属性的NIR图像采集系统时，所得的阈值图像可用作辐射方向图的初步评估。

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