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Dynamic performance of graphene field effect transistor with contact resistance

机译:具有接触电阻的石墨烯场效应晶体管的动态性能

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Here we report the impact of source/drain contact resistance on the dynamic characteristics of large area Graphene Field Effect Transistor (GFET). Although silicon has been the most widely used semiconductor in the channel of MOSFETs, it is approaching to its physical limits. On the other hand, graphene has been deeply studied as a potential alternative; however its zero band gap forbids the applicability in logic devices. Still GFETs have a great prospect in radio frequency (RF) and microwave devices mainly due to its excellent transport as well as structural properties. Here we found the contact resistance of realistic devices with Ti, Au, Pt, and Ni contact has a great impact on the transconductance as well as the cut-off frequency of the device. They are found to decrease by almost 60% when contact resistance goes to 750 Ω.
机译:在这里,我们报告了源极/漏极接触电阻对大面积石墨烯场效应晶体管(GFET)动态特性的影响。尽管硅已成为MOSFET通道中使用最广泛的半导体,但它已接近其物理极限。另一方面,石墨烯作为一种潜在的替代品已被深入研究。但是,其零带隙禁止在逻辑设备中应用。 GFET在射频(RF)和微波设备方面仍具有广阔的前景,这主要是由于其出色的传输性能和结构特性。在这里,我们发现具有Ti,Au,Pt和Ni接触的实际器件的接触电阻对器件的跨导以及截止频率有很大的影响。发现当接触电阻达到750Ω时,它们将降低近60%。

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