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首页> 外文会议>2016 IEEE Asian Hardware-Oriented Security and Trust >On-chip substrate-bounce monitoring for laser-fault countermeasure
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On-chip substrate-bounce monitoring for laser-fault countermeasure

机译：片上衬底反弹监控，用于激光故障对策

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摘要

This paper presents a reactive sensor-based IC countermeasure against a laser-fault injection attack on a cryptographic processor. IC substrate potential bounce due to laser injection is in-situ monitored by distributed 1bit compact comparators to raise the alarm against the attack. Since the laser power to induce fault is very high, the associated substrate bounce is large and wide-spread over a broad chip area. The efficient attack detection is thus possible with small hardware overhead. To further squeeze the overhead, an optimal sensor design methodology is proposed. An in-situ precise measurement of the bounce by utilizing an on-chip monitor successfully pre-characterizes the magnitude of the critical substrate bounce causing fault injection. The sensor sensitivity, position, and pitch could be optimized accordingly. A test chip is designed and fabricated in 0.18μm CMOS to evaluate the efficiency and validity of the proposed countermeasure.
机译：本文提出了一种基于反应式传感器的IC对策，以防止对加密处理器进行激光故障注入攻击。分布式1bit紧凑型比较器可对由于激光注入而引起的IC基板电位反弹进行实时监控，以发出针对攻击的警报。由于引起故障的激光功率非常高，因此相关的基板反弹很大，并且在较宽的芯片区域上广泛分布。因此，可以以较小的硬件开销进行有效的攻击检测。为了进一步压缩开销，提出了一种优化的传感器设计方法。利用片上监视器对跳动进行原位精确测量，可以成功地预先表征导致故障注入的关键基板跳动的幅度。可以相应地优化传感器的灵敏度，位置和间距。设计并在0.18μmCMOS中制作了测试芯片，以评估所提出对策的效率和有效性。

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