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首页> 外文会议>2016 IEEE Asian Hardware-Oriented Security and Trust >Laser irradiation on EEPROM sense amplifiers enhances side-channel leakage of read bits
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Laser irradiation on EEPROM sense amplifiers enhances side-channel leakage of read bits

机译：EEPROM感应放大器上的激光照射增强了读取位的侧通道泄漏

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摘要

Side-channel attacks that compromise confidentiality of memory contents have become a major concern for device manufacturers and users. Electrically erasable programmable read-only memory (EEPROM) implemented on embedded devices contains several types of sensitive information, and it shall strictly prohibit unauthorized access to such information. This paper introduces a new technique that extracts data while reading from EEPROM using a combination of power analysis and laser irradiation techniques. One characteristic of the proposed method is that it uses laser irradiation onto a sense amplifier in a manner that enables it to obtain multiple bits for each irradiation position. This also implies that we can obtain sensitive information from memory content selectively, as the proposed method extracts the read bits via a sense amplifier (values while reading in real time) rather than states of memory cell. Another characteristic of this method is that the laser injects no logical errors onto the target devices. Because the proposed method uses laser induced current, conventional software countermeasures against fault-based attacks are ineffective against it. To demonstrate the effectiveness of the proposed method, this paper exhibits a data extraction experiment recovering the complete contents of a test program stored in the flash EEPROM contained in an ATMega 8515 microcontroller.
机译：损害存储器内容机密性的旁通道攻击已成为设备制造商和用户的主要关注点。在嵌入式设备上实现的电可擦可编程只读存储器（EEPROM）包含多种类型的敏感信息，并且应严格禁止未经授权访问此类信息。本文介绍了一种新技术，该技术结合了功率分析和激光辐照技术，可在从EEPROM读取数据时提取数据。所提出的方法的一个特征是，它以一种方式对感测放大器使用激光辐照，以使其能够针对每个辐照位置获得多个位。这也意味着我们可以有选择地从存储内容中获取敏感信息，因为该方法通过检测放大器（实时读取时的值）而不是存储单元的状态来提取读取位。该方法的另一个特点是，激光不会将逻辑错误注入目标设备。由于建议的方法使用激光感应电流，因此针对基于故障的攻击的常规软件对策对其无效。为了证明该方法的有效性，本文展示了一个数据提取实验，该实验可以恢复存储在ATMega 8515微控制器中的快速EEPROM中的测试程序的全部内容。

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