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CEM-based extraction method for measuring complex permittivity

机译:基于CEM的复介电常数提取方法

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A common way to determine the electromagnetic properties of dielectric materials is to insert a sample of the material into a waveguide and measure the resulting reflection and transmission, i.e. the S-parameters. From the S-parameters the complex permittivity, e can then be extracted by use of various inversion schemes/algorithms, such as Nicolson-Ross-Weir (NRW) method. However, the NRW method is known to have inherently poor accuracy for high-permittivity materials. To mitigate this deficiency, here we propose an alternative approach for material parameter extraction. The novel method is based on measured S-parameter data and computational electromagnetics (CEM) simulation. In this method there is no restrictions on the shape and size of the material under test (MUT), as long as it fits in the waveguide and can be modeled with the CEM codes. In addition, the MUT does not have to be a single dielectric sample but it may be part of a combined metal/dielectric structure. We demonstrated this approach by measuring the complex permittivity of titanium dioxide (TiO2) ceramic samples, with typical relative permittivity of 100.
机译:确定介电材料电磁特性的一种常用方法是将材料样本插入波导中,然后测量反射和透射的结果,即S参数。然后可以通过使用各种反演方案/算法(例如Nicolson-Ross-Weir(NRW)方法)从S参数中提取复介电常数e。但是,已知NRW方法对于高介电常数材料固有地较差的精度。为了减轻这种不足,这里我们提出了一种替代的方法来提取材料参数。该新方法基于测得的S参数数据和电磁计算(CEM)仿真。在此方法中,对被测材料(MUT)的形状和尺寸没有限制,只要它适合波导并可以用CEM代码建模即可。此外,MUT不必是单个电介质样本,而可以是金属/电介质组合结构的一部分。我们通过测量二氧化钛(TiO2)陶瓷样品的复介电常数(典型相对介电常数为100)证明了这种方法。

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