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Deterministic methodology to evaluate BTI impact on logic gates propagation delay

机译:评估BTI对逻辑门传播延迟的影响的确定性方法

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摘要

The propagation delay variation induced by BTI in logic gates is studied. Using the deterministic BTI model introduced by our group in [1], a detailed description of its implementation in a commercial SPICE tool is presented. Simulations concerning the dependence of the BTI-induced propagation delay on the supply voltage and on the DC stress time of NAND gates are presented. The different impact of BTI for both low-high-low and high-low-high levels pulses is evaluated.
机译:研究了BTI在逻辑门中引起的传输延迟变化。使用我们小组在[1]中介绍的确定性BTI模型,详细介绍了其在商用SPICE工具中的实现。提出了有关BTI引起的传播延迟对电源电压和与非门的DC应力时间的依赖性的仿真。评估了BTI对低-高-低和高-低-高电平脉冲的不同影响。

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