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首页> 外文会议>2018 IEEE 2nd International Conference on Dielectrics >Dielectric Response of Cross-Linked Polyethylene (XLPE) Cable Insulation Material to Radiation and Thermal Aging
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Dielectric Response of Cross-Linked Polyethylene (XLPE) Cable Insulation Material to Radiation and Thermal Aging

机译：交联聚乙烯（XLPE）电缆绝缘材料对辐射和热老化的介电响应

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This work seeks dielectric indicators of the aged state of cross-linked polyethylene (XLPE) that has been simultaneously irradiated and thermally aged. The XLPE samples studied here were of the same material formulation as XLPE insulation found in RSCC I46-0021 instrumentation cable, formed into tapes with dimensions approximately 20 × 0.7 × 100 mmn3n. Aging was conducted by suspending the samples from a rack within an oven and subsequently exposing oven and samples to gamma radiation. Samples were aged at 60, 90, and 115 °C, with gamma-radiation dose rates from 0 to 450 Gy/h with total received doses from 0 to 216 kGy. The dielectric spectra of these samples were measured over the frequency range 1 Hz to 1 MHz using custom electrodes and a Novocontrol dielectric spectrometer before dielectric breakdown strength was measured on the same samples. Dielectric loss tangent was observed to increase as a function of dose, dose rate and exposure time for XLPE samples exposed as described above. Dielectric loss tangent did not, however, show sensitivity to thermal aging for the range of temperatures studied. Dielectric breakdown strength initially increased as the material oxidized, then decreased for more extreme aging, due to chain scission. It is concluded that dielectric loss tangent is a promising indicator of XLPE aging due to gamma radiation exposure.
机译：这项工作旨在寻找交联聚乙烯（XLPE）的老化状态的介电指示器，该交联聚乙烯已同时受到照射和热老化。此处研究的XLPE样品具有与RSCC I46-0021仪器电缆中发现的XLPE绝缘材料相同的材料配方，并制成尺寸约为20×0.7×100 mmn的胶带。 org / 1998 / Math / MathML” xmlns：xlink =“ http://www.w3.org/1999/xlink”> 3 n。老化是通过将样品从架子上的烤箱中悬挂下来，然后将烤箱和样品暴露在伽玛射线下进行的。样品分别在60、90和115°C下老化，γ辐射剂量率为0至450 Gy / h，总接收剂量为0至216 kGy。使用定制电极和Novocontrol介电谱仪在1 Hz至1 MHz的频率范围内测量这些样品的介电谱，然后再对相同样品进行介电击穿强度的测量。对于如上所述暴露的XLPE样品，观察到介电损耗正切随剂量，剂量率和暴露时间的变化而增加。然而，介电损耗角正切在所研究的温度范围内未显示出对热老化的敏感性。介电击穿强度最初随着材料的氧化而增加，然后由于断链而降低，以进行更极端的老化。结论是，介电损耗正切是由于γ射线暴露而导致XLPE老化的有希望的指标。

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