首页> 外文会议>22nd Annual Meeting of the Adhesion Society, Feb 21-24, 1999, Panama City Beach, Florida >ADHESION STUDIES AT DIE ATTACH EPOXY - COPPER LEADFRAME INTERFACES
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ADHESION STUDIES AT DIE ATTACH EPOXY - COPPER LEADFRAME INTERFACES

机译:模具连接环氧树脂-铜铅框架界面的附着力研究

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The objective of this investigation is to deepen our understanding of the adhesive strength of silver-filled, epoxy-based adhesives bonded to typical lead frame surfaces such as copper. Such interfaces are common place in the microelectronics industry and can play an important role in the reliability of plastic encapsulated packages. The experimental approach consists of characterizing surfaces using advancing contact angles, determining the interfacial and bulk fracture toughness using linear elastic fracture mechanics, and elucidating fracture mechanisms using microscopy. The interplay between intrinsic and extrinsic crack-tip shielding mechanism on the observed adhesive strength is discussed.
机译:这项研究的目的是加深我们对粘结在典型引线框架表面(例如铜)上的填充银的环氧树脂基粘合剂的粘合强度的了解。这种接口在微电子工业中很常见,并且可以在塑料封装的可靠性中发挥重要作用。实验方法包括使用前进的接触角表征表面,使用线性弹性断裂力学确定界面和整体断裂韧度以及使用显微镜阐明断裂机理。讨论了内在和外在的裂纹尖端屏蔽机制对观察到的粘合强度之间的相互作用。

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