ATOMIC FORCE MICROSCOPY INVESTIGATION OF SOLVENT INTERACTIONS WITH SILICONE ADHESIVES

机译：硅酮胶与溶剂相互作用的原子力显微镜研究

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Force versus distance (FD) curve measurements are a sensitive probe for the interaction of silicone surfaces to polar/hydrophobic and non-polar/hydrophilic solvents. Further work is needed to evaluate the importance of surface tension and wetting and to determine the work of adhesion, and the effect of solvents on the reorganization of the silicone polymer surface after contact with strongly interacting solvents. These results are being correlated to conventional peel testing and can be applied to understanding the effects of solvent exposure on adhesion of silicone to substrate surfaces.

机译：力与距离（FD）曲线测量是用于硅树脂表面与极性/疏水和非极性/亲水溶剂相互作用的灵敏探针。需要进一步的工作来评估表面张力和润湿的重要性，并确定粘附作用，以及在与强相互作用溶剂接触后溶剂对有机硅聚合物表面重组的影响。这些结果与常规剥离测试相关，可用于了解溶剂暴露对有机硅与基材表面粘附的影响。

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来源
《22nd Annual Meeting of the Adhesion Society, Feb 21-24, 1999, Panama City Beach, Florida》|1999年|p.224-226|共3页
会议地点 Panama FL(US);Panama FL(US)
作者
Russell A. Lipeles; Daniel L. LaMar; Thomas W. Giants;
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作者单位

The Aerospace Corporation, El Segundo, CA 90245;

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原文格式 PDF
正文语种 eng
中图分类无线电电子学、电信技术;
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4. Atomic force microscopy investigation of solvent interactions with silicone adhesives [C] . Russell A. Lipeles, Daniel L. LaMar, Thomas W. Giants Annual Meeting of the Adhesion Society . 1999

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ATOMIC FORCE MICROSCOPY INVESTIGATION OF SOLVENT INTERACTIONS WITH SILICONE ADHESIVES

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