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首页> 外文会议>24th Session of the CIE (Commission Internationale De L'eclairage) Vol.1 Pt.1 Jun 24-30, 1999 Warsaw >TESTING OF LIGHT EMITTING DIODES IN PRODUCTION LINES
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TESTING OF LIGHT EMITTING DIODES IN PRODUCTION LINES

机译：生产线中发光二极管的测试

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摘要

We present a test system for the online measurement of the electrical and optical properties of light emitting diodes (LEDs) which is capable to be used in mass production of LEDs. Our system uses an array spectrometer rather than a photometer to measure the optical properties of the LED under test like the dominant, the peak, and the centroid wavelength, the luminous / radiant intensity, the luminous flux / radiant power, the chromaticity coordinates, the bandwidth, the spectral purity, and the color temperature. The electrical properties of the LED like forward voltage at a given forward current or backward current at a given backward voltage are measured by a high precision source meter unit which provides the bias for the LED. The source meter and the array spectrometer are controlled by a Pentium PC (operating system Windows NT 4.0) which in addition performs the evaluation and statistics of the measurements. Due to the use of a thinned back-illuminated CCD array spectrometer with highest sensitivity the acquisition time to measure the spectrum of the LED can be as low as 10 ms even if proper launching optics are used to fulfil the CIE requirements for measuring luminous intensity. Together with the electrical testing and the data evaluation less than 100 ms are needed to characterize an LED.
机译：我们提供了一种用于在线测量发光二极管（LED）的电和光学特性的测试系统，该系统可用于LED的批量生产。我们的系统使用阵列光谱仪而不是光度计来测量被测LED的光学特性，例如主要，峰值和质心波长，发光/辐射强度，光通量/辐射功率，色度坐标，带宽，光谱纯度和色温。 LED的电学特性，如给定正向电流下的正向电压或给定反向电压下的反向电流，是由高精度源计单元测量的，该源表可为LED提供偏置。源表和阵列光谱仪由奔腾PC（操作系统Windows NT 4.0）控制，该计算机还执行评估和测量统计信息。由于使用了灵敏度最高的超薄背照式CCD阵列光谱仪，因此即使使用适当的发射光学器件来满足CIE的发光强度要求，用于测量LED光谱的采集时间也可以低至10 ms。只需不到100毫秒的电气测试和数据评估就可以表征LED。

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