首页> 外文会议>2nd EOS conference on manufacturing of optical components 2011 >Measuring amplitude and phase of light emerging from microstructures with HRIM
【24h】

Measuring amplitude and phase of light emerging from microstructures with HRIM

机译:使用HRIM测量微结构发出的光的振幅和相位

获取原文
获取原文并翻译 | 示例

摘要

Ultra high-resolution measurements of amplitude and phase field distributions emerging from a 1-μm-period amplitude grating are presented and discussed. In the axial direction periodically repeated features are found, whose origins are the Talbot effect within the Fresnel diffraction regime. Filtering diffraction orders in the back focal plane of the observing objective provides specific Talbot images and allows to intuitively understand the role of diffraction orders in this phenomenon.
机译:提出并讨论了从1μm周期振幅光栅中出现的振幅和相场分布的超高分辨率测量。在轴向方向上发现了周期性重复的特征,其起源是菲涅耳衍射范围内的塔尔博特效应。在观察物镜的后焦平面中过滤衍射级将提供特定的Talbot图像,并可以直观地理解衍射级在此现象中的作用。

著录项

  • 来源
  • 会议地点 Munich(DE);Munich(DE)
  • 作者单位

    Ecole Polytechnique Federate de Lausanne (EPFL), Optics Photonics Technology Laboratory, Neuchatel, CH-2000, Switzerland;

    Ecole Polytechnique Federate de Lausanne (EPFL), Optics Photonics Technology Laboratory, Neuchatel, CH-2000, Switzerland;

    Ecole Polytechnique Federate de Lausanne (EPFL), Optics Photonics Technology Laboratory, Neuchatel, CH-2000, Switzerland;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 光学仪器;
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号