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首页> 外文会议>3rd International Workshop on Structural Health Monitoring, Sep 12-14, 2001, Stanford University >Electro-Mechanical Impedance Method for Crack Detection in Thin Wall Structures
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Electro-Mechanical Impedance Method for Crack Detection in Thin Wall Structures

机译：薄壁结构裂缝检测的机电阻抗法

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摘要

The Electro-Mechanical (E/M) impedance method has achieved acceptance among NDE methods due to its relative simplicity, applicability to complex structures, and low cost of active piezoelectric elements. Thus, allow one to identify the structural dynamics directly by obtaining its E/M impedance or admittance signatures. Previous work reported on this method contained little theoretical work but described many practical applications. The scope of presented research was to extend the positive results obtained for 1-D structure onto 2-D thin-wall structures with circular symmetry. Theoretical analysis was analytically performed on simple geometries (circular plates) subjected to particular set of boundary conditions. The experimental results shown that E/M impedance (or admittance) spectrum accurately identify the natural frequency spectrum of the specimens manufactured from the aircraft-grade thin-gage material. Changes in the E/M impedance spectrum due to presence of crack were investigated. The dependence of the frequency spectrum on crack location was studied. The results show changing in E/M impedance spectrum due to damage presence. Additional recommendations are given to improve applications of the E/M impedance method for aging aircraft-type structures to detect incipient cracks and corrosion damage.
机译：机电（E / M）阻抗方法因其相对简单，适用于复杂结构以及有源压电元件成本低等优点而在NDE方法中获得认可。因此，允许人们通过获得其E / M阻抗或导纳签名直接识别结构动力学。以前报道的有关该方法的工作几乎没有理论性的工作，但却描述了许多实际应用。提出的研究范围是将一维结构的正结果扩展到具有圆形对称性的二维薄壁结构上。理论分析是在经受特定边界条件集的简单几何形状（圆形板）上进行的。实验结果表明，E / M阻抗（或导纳）谱可准确识别由飞机级薄测距材料制成的样本的自然频谱。研究了由于裂纹的存在而引起的E / M阻抗谱的变化。研究了频谱对裂纹位置的依赖性。结果表明，由于存在损坏，E / M阻抗谱发生了变化。给出了其他建议，以改进E / M阻抗方法在老化飞机结构上的应用，以检测初期裂纹和腐蚀破坏。

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