首页> 外文会议>55th IWCS/Focus~TM Conference >Wire, Optical Fibre And Cable, In Line Surface Quality Measurement And Defect Detection (SQM): Presentation Of The Development Test Results (Second Development Phase)
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Wire, Optical Fibre And Cable, In Line Surface Quality Measurement And Defect Detection (SQM): Presentation Of The Development Test Results (Second Development Phase)

机译:电线,光纤和电缆,在线表面质量测量和缺陷检测(SQM):演示开发测试结果(第二开发阶段)

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摘要

This presentation continue the previous one made for IWCS 2005 on basic principles and applications. The present one describe the progresses and present expectations after the first prototype development and experimentations. 1. The bad news is the SQM is not still ready for sale. 2. The good news is that it already can works for some applications at lower frequency and the technology we need to get the full performance is available and will be included soon. After running the first prototype, it appears we had to adapt the initial target to the technology limitations while keeping customer expectations. Some applications, need turn frequency at 200kHz, but accept 60 only dots per turn. This is already a far better resolution than all existing instruments for surface defect detection. Others, need high resolution, up to 200 dots per turn, but frequency significantly reduced, down to 80kHz.
机译:本演示文稿是上一届IWCS 2005的基本原理和应用的延续。本文档描述了第一个原型开发和实验之后的进展和当前的期望。 1.坏消息是SQM尚未准备好出售。 2.好消息是它已经可以在某些较低频率的应用程序上使用,并且我们需要获得完整性能的技术,并且即将推出。在运行第一个原型之后,我们似乎不得不在满足客户期望的同时使初始目标适应技术限制。某些应用需要200kHz的转折频率,但每转只能接受60个点。这已经比所有现有的用于表面缺陷检测的仪器要好得多。其他的则需要高分辨率,每圈最多可容纳200个点,但频率却明显降低,低至80kHz。

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