首页> 外文会议>59th ARFTG (Automatic RF Techniques Group) Conference Digest, Jun 7, 2002, Seattle, Washington >Modeling Ground Signal Probe Invasiveness and its Effect on Extracted Inductor Q
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Modeling Ground Signal Probe Invasiveness and its Effect on Extracted Inductor Q

机译:模拟地面信号探针的侵入性及其对提取电感Q的影响

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摘要

The invasive nature of the Ground-Signal wafer probe is modeled and its effect on extracted inductor Q is investigated. Data is presented demonstrating that the extracted Q of surface mount (SMT) inductors is lower when measured with Ground-Signal (GS) versus Ground-Signal-Ground (GSG) coaxial wafer probes. We believe that the degradation in Q is caused by a Quasi-TEM mode that effectively adds resistive loss to the inductor. A simple circuit model is proposed which accounts for the interaction of this mode with the inductor.
机译:对接地信号晶片探针的侵入性进行了建模,并研究了其对提取的电感器Q的影响。呈现的数据表明,与地面信号-地面(GSG)同轴晶圆探针相比,使用地面信号(GS)进行测量时,表面贴装(SMT)电感器的提取Q值较低。我们认为,Q的下降是由准TEM模式引起的,该模式有效地增加了电感的电阻损耗。提出了一个简单的电路模型,该模型考虑了该模式与电感器的相互作用。

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