首页> 外文会议>5th International Symposium on Test and Measurement (ISTM/2003) Vol.3 Jun 1-5, 2003 Shenzhen, China >MEASUREMENT OF COMPLEX PERMITTIVITY AND PERMEABILITY OF HIGH LOSS DIELECTRIC MATERIAL AS A FUNCTION OF TEMPERATURE
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MEASUREMENT OF COMPLEX PERMITTIVITY AND PERMEABILITY OF HIGH LOSS DIELECTRIC MATERIAL AS A FUNCTION OF TEMPERATURE

机译:高损耗介电材料的复介电常数和磁导率的测量,作为温度的函数

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摘要

The paper mainly brings forward a new and simple test set measuring the temperature dependence of complex permittivity and permeability of high loss dielectric material covering X band. The temperatures vary from room temperature to 200℃, and the temperature stability is controlled in +- 0.2℃. The transmission line used in this paper is rectangle waveguide. The paper also made calibration kit used in high temperatures and applied TRL calibration method.
机译:本文主要提出了一种新的简单测试仪,用于测量覆盖X波段的高损耗介电材料的复介电常数和磁导率与温度的关系。温度从室温到200℃不等,温度稳定性控制在±0.2℃。本文使用的传输线是矩形波导。本文还制作了用于高温的校准套件并应用了TRL校准方法。

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