Design for Testability Research of System Degree

机译：系统度可测性研究设计

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Became of the electronic system gradually complex, request must fully consider the testability of the system at the beginning of system total design, not after system total design accomplish. The design for testability of the system include construct standardize design, BIT(Built-in Test)design and. design for testability of PCB, Because of the design for testability may greatly improve the test, detect and diagnose ability of the system, so it must cause extensive concern and get quickly development.

机译：由于电子系统逐渐复杂，要求必须在系统总体设计之初而不是系统总体设计完成后就充分考虑系统的可测试性。系统的可测试性设计包括构造标准化设计，BIT（内置测试）设计和。 PCB的可测试性设计，由于可测试性设计可能会大大提高系统的测试，检测和诊断能力，因此必须引起广泛关注并得到快速开发。

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来源
《5th International Symposium on Test and Measurement (ISTM/2003) Vol.6 Jun 1-5, 2003 Shenzhen, China》|2003年|p.4799-4802|共4页
会议地点 Shenzhen(CN);Shenzhen(CN)
作者
Zhang Hongwei; Xia Mingfei; Li Zhiqiang;
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作者单位

Optics and Electric Department Ordnance Engineering College ShiJiaZhuang 050003, China;

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会议组织
原文格式 PDF
正文语种 eng
中图分类一般工业技术;
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Design for Testability Research of System Degree

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