首页> 外文会议>7th International Conference on Electromagnetic Processing of Materials >Deformation and failure of damage-free submicron-sized metallic glass wires under uniaxial tension
【24h】

Deformation and failure of damage-free submicron-sized metallic glass wires under uniaxial tension

机译:单轴拉伸下无损亚微米级金属玻璃丝的变形和失效

获取原文
获取原文并翻译 | 示例

摘要

Field ion microscopy was applied for uniaxial tension tests at cryogenic temperature.The plastic deformation of near damage-free submicron-sized metallic glass wires was found to remain shear band operation even the diameter was less than 200 nm.The critical sample dimension for inhomogeneous-to-homogeneous transition may be overestimated before.
机译:现场离子显微镜应用于低温下的单轴拉伸试验,发现即使直径小于200 nm,近乎无损伤的亚微米级金属玻璃丝的塑性变形仍保持剪切带操作。向均质过渡之前可能被高估了。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号