OLED degradation mechanism study using impedance spectroscopy

著录项

• 来源
  《IMID/IDMC/ASIA DISPLAY 2008;International display manufacturing conference 2008;International meeting on information display;Asia display 2008》|2008年|p.1022-1025|共4页
• 会议地点 Ilsan(KR);Ilsan(KR);Ilsan(KR);Ilsan(KR)
• 作者

  Hyunjong Kim; Jihoon Yang; Seokmin Ye; Jaewook Jeong; Seung Wook Chang; Crystal Boris; Ho Kyoon Chung; Changhee Lee; Yongtaek Hong;

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• 作者单位

  Dept. of EECS, Seoul National University, Seoul 151-744, KOREA;

  rnDept. of EECS, Seoul National University, Seoul 151-744, KOREA;

  rnDept. of EECS, Seoul National University, Seoul 151-744, KOREA;

  rnDept. of EECS, Seoul National University, Seoul 151-744, KOREA;

  rnCorporate RD Center, Display Lab, Samsung SDI Co., Ltd., 428-5 Gongse-Dong, Kiheung-Gu, Yongin-Si, Gyeonggi-do 449-577, KOREA;

  rnCorporate RD Center, Display Lab, Samsung SDI Co., Ltd., 428-5 Gongse-Dong, Kiheung-Gu, Yongin-Si, Gyeonggi-do 449-577, KOREA;

  rnCorporate RD Center, Display Lab, Samsung SDI Co., Ltd., 428-5 Gongse-Dong, Kiheung-Gu, Yongin-Si, Gyeonggi-do 449-577, KOREA;

  rnDept. of EECS, Seoul National University, Seoul 151-744, KOREA;

  rnDept. of EECS, Seoul National University, Seoul 151-744, KOREA TEL:82-2-880-9567, e-mail;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类 显示技术;显示设备、显示器;
• 关键词

  OLED; degradation; frequency; active-matrix; digital driving;

  机译：OLED;降解;频率;有源矩阵数字驾驶;