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Growth and Characterization of Single-Crystal Multilayer Nanostructures for Fast Ion Conduction

机译:快速离子传导的单晶体多层纳米结构的生长和表征

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摘要

Single-crystal multi-layered thin films of pure and mixed ceria and zirconia were heteroepitaxially grown using molecular beam epitaxy on yttria stabilized zirconia substrates. The growth of these films was monitored using in-situ reflection high-energy electron diffraction (RHEED). In addition, the ex-situ characterization techniques including X-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM) and Rutherford backscattering spectrometry (RBS) along with ion channeling were used to further characterize these films.
机译:使用分子束外延在钇稳定的氧化锆衬底上异质外延生长纯的和混合的二氧化铈和氧化锆的单晶多层薄膜。使用原位反射高能电子衍射(RHEED)监测这些膜的生长。此外,异位表征技术包括X射线衍射(XRD),高分辨率透射电子显微镜(HRTEM)和卢瑟福背散射光谱(RBS)以及离子通道技术被用于进一步表征这些薄膜。

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