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The Effect of Processes on the Reliability of GaN Based Light Emitting Diodes

机译:工艺对GaN基发光二极管可靠性的影响

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摘要

According to our rich experiences on manufacturing of high reliability GaN based Light Emitting Diodes, we try to expatiate the relations between processes and device reliability on five aspects in this paper. In addition, we lay out some of our solutions on the five aspects and show our stable device.
机译:根据我们在制造高可靠性GaN基发光二极管方面的丰富经验,我们试图从五个方面阐述工艺与器件可靠性之间的关系。此外,我们在五个方面列出了一些解决方案,并展示了我们的稳定设备。

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