Characterization of CdTe x-ray sensor layer on Medipix detector chips

著录项

• 来源
  《Advanced materials and nanotechnology》|2011年|p.170-173|共4页
• 会议地点 Wellington(NZ);Wellington(NZ)
• 作者

  R Aamir; M F Walsh; S P Lansley; R M Doesburg; R Zainon; N J A de Ruiter; P H Butler; A P H Butler;

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• 作者单位

  Department of Physics Astronomy, University of Canterbury, Christchurch, N.Z.;

  University of Otago Christchurch, N.Z.;

  Department of Physics Astronomy, University of Canterbury, Christchurch, N.Z.,MacDiarmid Institute for Advanced Materials Nanotechnology, University of Canterbury, Christchurch, N.Z.;

  Department of Physics Astronomy, University of Canterbury, Christchurch, N.Z.;

  Department of Physics Astronomy, University of Canterbury, Christchurch, N.Z.;

  HIT Lab NZ, University of Canterbury, Christchurch, N.Z.;

  Department of Physics Astronomy, University of Canterbury, Christchurch, N.Z.,European Centre for Nuclear Research (CERN), Geneva, Switzerland;

  University of Otago Christchurch, N.Z.,European Centre for Nuclear Research (CERN), Geneva, Switzerland,Department of Electrical and Computer Engineering, University of Canterbury, Christchurch, N.Z.;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类 工程材料一般性问题;
• 关键词

  medipix; x-ray detectors; MARS-CT; compound semiconductors; cadmium telluride; gold nano-particles; sensitivity variations;

  机译：medipix; X射线探测器；火星计算机断层扫描复合半导体碲化镉金纳米颗粒；灵敏度变化;