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The ultraviolet detection component based on Te-Cs image intensifier

机译：基于Te-Cs图像增强器的紫外线检测组件

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摘要

Ultraviolet detection technology has been widely focused and adopted in the fields of ultraviolet warning and corona detection for its significant value and practical meaning. The component structure of ultraviolet ICMOS, imaging driving and the photon counting algorithm are studied in this paper. Firstly, the one-inch and wide dynamic range CMOS chip with the coupling optical fiber panel is coupled to the ultraviolet image intensifier. The photocathode material in ultraviolet image intensifior is Te-Cs, which contributes to the solar blind characteristic, and the dual micro-channel plates (MCP) structure ensures the sufficient gain to achieve the single photon counting. Then, in consideration of the ultraviolet detection demand, the drive circuit of the CMOS chip is designed and the corresponding program based on Verilog language is written. According to the characteristics of ultraviolet imaging, the histogram equalization method is applied to enhance the ultraviolet image and the connected components labeling way is utilized for the ultraviolet single photon counting. Moreover, one visible light video channel is reserved in the ultraviolet ICOMS camera, which can be used for the fusion of ultraviolet and visible images. Based upon the module, the ultraviolet optical lens and the deep cut-off solar blind filter are adopted to construct the ultraviolet detector. At last, the detection experiment of the single photon signal is carried out, and the test results are given and analyzed.
机译：紫外线检测技术以其重要的价值和实际意义，已经在紫外线预警和电晕检测领域得到了广泛的关注和采用。研究了紫外ICMOS的组成结构，成像驱动和光子计数算法。首先，将具有耦合光纤面板的1英寸宽动态范围CMOS芯片耦合至紫外图像增强器。紫外线图像增强器中的光电阴极材料是Te-Cs，这有助于实现日光盲特性，双微通道板（MCP）结构可确保获得足够的增益来实现单光子计数。然后，考虑到紫外线检测的需求，设计了CMOS芯片的驱动电路，并编写了基于Verilog语言的相应程序。根据紫外成像的特点，采用直方图均衡化方法增强紫外图像，并采用连接成分标记的方式进行紫外单光子计数。此外，紫外ICOMS相机中保留了一个可见光视频通道，可用于融合紫外图像和可见图像。在该模块的基础上，采用紫外光学透镜和深截止日盲滤光片构成了紫外探测器。最后进行了单光子信号的检测实验，给出了测试结果并进行了分析。

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  • 来源
    《Advanced Photon Counting Techniques XI》|2017年|102120S.1-102120S.8|共8页
  • 会议地点 Anaheim(US)
  • 作者

    Yunsheng Qian; Xiaoyu Zhou; Yujing Wu; Yan Wang; Hua Xu;

  • 作者单位

    School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, 210094, China;

    School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, 210094, China;

    School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, 210094, China;

    School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, 210094, China;

    School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, 210094, China;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Dynamic range CMOS; Ultraviolet image; Connected components labeling; Ultraviolet single photon counting;

    机译：动态范围CMOS;紫外线图像;连接的组件标签;紫外线单光子计数;

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