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首页> 外文会议>Advanced Wavefront Control: Methods, Devices, and Applications IV >Closed-loop adaptive optics using a CMOS image quality metric sensor
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Closed-loop adaptive optics using a CMOS image quality metric sensor

机译：使用CMOS图像质量度量传感器的闭环自适应光学器件

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摘要

When compared to a Shack-Hartmann sensor, a CMOS image sharpness sensor has the advantage of reduced complexity in a closed-loop adaptive optics system. It also has the potential to be implemented as a smart sensor using VLSI technology. In this paper, we present a novel adaptive optics testbed that uses a CMOS sharpness imager built in the New Mexico State University (NMSU) Electro-Optics Research Laboratory (EORL). The adaptive optics testbed, which includes a CMOS image quality metric sensor and a 37-channel deformable mirror, has the capability to rapidly compensate higher-order phase aberrations. An experimental performance comparison of the pinhole image sharpness feedback method and the CMOS imager is presented. The experimental data shows that the CMOS sharpness imager works well in a closed-loop adaptive optics system. Its overall performance is better than that of the pinhole method, and it has a fast response time.
机译：与Shack-Hartmann传感器相比，CMOS图像清晰度传感器具有降低闭环自适应光学系统复杂性的优势。它还具有使用VLSI技术实现为智能传感器的潜力。在本文中，我们介绍了一种新颖的自适应光学测试平台，该平台使用在新墨西哥州立大学（NMSU）电光研究实验室（EORL）中内置的CMOS清晰度成像器。自适应光学测试台包括一个CMOS图像质量度量传感器和一个37通道可变形反射镜，能够快速补偿高阶相位像差。提出了针孔图像清晰度反馈方法与CMOS成像仪的实验性能比较。实验数据表明，CMOS清晰度成像器在闭环自适应光学系统中工作良好。其总体性能优于针孔法，并且响应时间短。

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