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Monitoring the last two (AR) layers in narrow bandpass filters

机译:监视窄带通滤波器中的最后两层(AR)

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The final corrections which might be made in the last two antireflection (AR) layers in the deposition of narrow bandpass filter designs such as might be used for Dense Wavelength Division Multiplexing (DWDM) in the fiber optics communications field were discussed in a previous report. A broader range of techniques and simulations of those final layer adjustments are described here, how they can be done, and the benefits which might be obtained. A surprisingly simple new technique is given which should yield improved results.
机译:在先前的报告中讨论了在窄带通滤波器设计的沉积过程中,在最后两个抗反射(AR)层中可能进行的最终校正,例如可用于光纤通信领域的密集波分复用(DWDM)。此处介绍了这些最终层调整的更广泛的技术和模拟,如何完成这些调整以及可能获得的好处。给出了一种令人惊讶的简单新技术,该新技术将产生更好的结果。

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