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Method for the optical measurement of size and complex index of laser damage precursors in optical components

机译：光学部件中激光损伤前体的尺寸和复指数的光学测量方法

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摘要

Laser damage in optical components is caused mainly by the presence of sub-micronic defects, inherent to the manufacturing process (metal or dielectric inclusions, fractures, bubbles). An improvement of the laser damage threshold requires an analysis of damage process and an identification of the laser damage precursors. However, the assumed nanometer size of such precursors makes their identification difficult by the usual optical methods. In this paper, we present a method to obtain the size and complex index of laser damage precursors in thin films or substrates. This method is based on the knowledge of three parameters accessible to measurements, which are the precursor density, the laser damage threshold and the precursor absorption. Density and threshold are extracted from the fit of laser damage probability curves with the use of a statistic model and absorption is obtained with photothermal measurements. From these measurements, an electromagnetic and thermal model permits to obtain an estimation of both complex index and size of the laser damage precursors. The different experimental and theoretical tools are described in this paper : laser damage testing apparatus, photothermal bench, stochastic model for the interpretation of laser damage probability curves, electromagnetic and thermal model. An application example is given : we present our first results in silica thins films where sub-micronic laser damage initiators at 1064nm have been highlighted and identified with our method.
机译：光学组件中的激光损坏主要是由制造过程中固有的亚微米缺陷（金属或电介质夹杂物，破裂，气泡）引起的。激光损伤阈值的提高要求对损伤过程进行分析并确定激光损伤前体。然而，这种前体的假定的纳米尺寸使得通过常规光学方法难以识别它们。在本文中，我们提出了一种获取薄膜或基板中激光损伤前体的尺寸和复杂指数的方法。该方法基于可访问的三个参数的知识，即前驱物密度，激光损伤阈值和前驱物吸收。使用统计模型从激光损伤概率曲线的拟合中提取密度和阈值，并通过光热测量获得吸收。通过这些测量，电磁模型和热模型允许获得激光损伤前体的复指数和尺寸的估计值。本文介绍了不同的实验和理论工具：激光损伤测试仪，光热工作台，用于解释激光损伤概率曲线的随机模型，电磁和热模型。给出了一个应用示例：我们在二氧化硅薄膜中展示了我们的第一个结果，其中我们的方法突出了并鉴定了1064nm的亚微激光损伤引发剂。

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