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The impact of pulse duration on multiphoton ionization in the soft X-ray regime

机译:脉冲持续时间对软X射线条件下多光子电离的影响

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At the soft X-ray free electron laser FLASH, multiphoton ionization of free atoms has been studied by ion time-of-flight spectroscopy. Depending on the multiphoton mechanism, the ionization processes are influenced in different ways by the FEL pulse duration. This feature has been used, e.g., to measure the pulse duration of FLASH in the femtosecond regime by non-linear autocorrelation. In the present contribution, the impact of pulse duration on multiphoton ionization is discussed with an emphasis on the distinction between sequential and non-sequential processes, and collective electron excitation as well.
机译:在软X射线自由电子激光器FLASH上,已经通过离子飞行时间光谱学研究了自由原子的多光子电离。取决于多光子机制,电离过程受FEL脉冲持续时间的影响不同。此功能已用于,例如,通过非线性自相关来测量飞秒状态下FLASH的脉冲持续时间。在当前的贡献中,讨论了脉冲持续时间对多光子电离的影响,重点是顺序过程和非顺序过程之间的区别,以及集体电子激发。

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