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ELECTROSTATIC EFFECT ON JUMP-TO-CONTACT AND ATOM TRANSFER BETWEEN AFM TIP AND SUBSTRATE

机译:静电对原子力显微镜针尖和基质之间的跳变接触和原子转移的影响

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摘要

Dynamics of atoms around the interface of tip and substrate has close relationship to adhesive forces. This paper investigates the interactive behaviors by utilizing molecular dynamic (MD) simulation with the consideration of external applied electrostatic (ES) field between the atomic force microscopy (AFM) tip and substrate, which are both coated with gold. Morse potential was employed herein for modeling the energy between the atoms on the tip and substrate. The simulation model is composed of the gold-coated parts of the AFM tip and substrate, which are connected to the rest parts of the AFM tip and substrate, respectively, by the use of boundary conditions. The gold atoms were arranged in order according to face centric cubic (FCC) structure. The tip with the pyramidal shape was formed from 664 gold atoms while the substrate with cuboid shape was constructed from 2400 gold atoms. Simulation results show that both jump-to-contact interactions and the atom transfer increase as a result of enhancing the bias voltage between the tip and the substrate. The results agree well with experimental observation and also have the same trend as the experiment.
机译:尖端和基底界面周围的原子动力学与粘附力密切相关。本文利用分子动力学(MD)模拟研究了相互作用行为,同时考虑了原子力显微镜(AFM)尖端和被覆金的基体之间的外部施加的静电(ES)场。本文采用莫尔斯电势来模拟尖端和基底上原子之间的能量。该模拟模型由AFM尖端和基板的镀金部分组成,它们通过使用边界条件分别连接到AFM尖端和基板的其余部分。金原子按照面心立方(FCC)结构顺序排列。金字塔形的尖端由664个金原子形成,而长方体形的基底由2400个金原子构成。仿真结果表明,由于增强了尖端和基板之间的偏置电压,跳跃接触相互作用和原子转移都增加了。结果与实验观察结果吻合良好,与实验趋势一致。

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