首页> 外文会议>Annual Symposium on Quantitative Nondestructive Evaluation; 19980719-24; Snowbird,UT(US) >THERMAL AND COLD NEUTRON COMPUTED TOMOGRAPHY AT THE LOS ALAMOS NEUTRON SCATTERING CENTER USING AN AMORPHOUS SILICON DETECTOR ARRAY
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THERMAL AND COLD NEUTRON COMPUTED TOMOGRAPHY AT THE LOS ALAMOS NEUTRON SCATTERING CENTER USING AN AMORPHOUS SILICON DETECTOR ARRAY

机译:使用非晶硅探测器阵列在洛杉矶阿拉斯莫斯中子散射中心进行热和冷中子计算机断层扫描

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摘要

With a limited amount of beam time we were able to characterize several beam properties as well as produce images of test samples. The resolution of the images was limited only by the pixel size of the detector. Imaging with the a-Si detectors has been shown to produce quality digital images in a short amount of time with minimal setup, making it an attractive detector for many applications. No degradation in the detector was noticed during the collection of these images, however the scintillator material did suffer some discoloration and subsequent efficiency degradation.
机译:在有限的光束时间下,我们能够表征几种光束特性,并产生测试样品的图像。图像的分辨率仅受检测器像素大小的限制。使用a-Si检测器成像可在短时间内以最少的设置产生高质量的数字图像,这使其成为许多应用中有吸引力的检测器。在收集这些图像的过程中,没有发现检测器的性能下降,但是闪烁体材料确实会发生一些变色和随后的效率下降。

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