THE EVALUATION OF QUARTZ RESONATORS VIA X-RAY DIFFRACTION TOPOGRAPHY

机译：X射线衍射层析成像法对石英谐振器的评估

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X-ray diffraction topography can easily detect and image the presence of defects within a crystal, making it a powerful nondestructive evaluation tool for characterizing industrially important single crystal specimens such as quartz. Whether looking for gross defects (crystallographic misorientations) or smaller defects such as dislocations or even atomic (point defect) scale influences, the x-ray diffraction topographic techniques are well suited to a variety of applications. In the examples shown, x-ray topography was utilized to distinguish between "good" and "bad" resonators and evaluate the crystalline perfection of cultured, raw quartz samples produced in a new seeded crystal growth orientation. Further use of x-ray diffraction topography would aid in the optimization of such crystal growth and processing of quartz as well as other single crystal applications.

机译：X射线衍射形貌可以轻松检测晶体中的缺陷并对其成像，从而使其成为功能强大的非破坏性评估工具，用于表征工业上重要的单晶样本（例如石英）。无论是寻找总体缺陷（晶体学取向错误）还是较小的缺陷（例如位错或什至原子（点缺陷）规模的影响），X射线衍射形貌技术都非常适合各种应用。在所示的示例中，利用X射线形貌来区分“好”和“坏”谐振器，并评估以新的晶种生长取向生产的培养的原始石英样品的晶体完美度。 X射线衍射形貌的进一步使用将有助于这种晶体生长和石英加工以及其他单晶应用的优化。

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来源
《Annual Symposium on Quantitative Nondestructive Evaluation; 19980719-24; Snowbird,UT(US)》|1998年|P.2079-2086|共8页
会议地点 SnowbirdUT(US)
作者
K. G. Lipetzky; R. E. Green; Jr.; R. W. Armstrong; W. T. Beard; Jr.;
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Center for Nondestructive Evaluation The Johns Hopkins University Baltimore, MD 21218;

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原文格式 PDF
正文语种 eng
中图分类无损探伤仪器;
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1. Investigations by X-ray topography of quartz and langasite resonators [J] . Mateescu I, Capelle B, Detaint J, Journal de Physique, IV: Proceedings of International Conference . 2005,第0期

机译：X射线形貌研究石英和蓝硅铁矿谐振器
2. Evaluation of critical thickness of GaP_(0.98)N_(0.02) layer on GaP substrate by synchrotron X-ray diffraction topography [J] . H. Jussila, S. Nagarajan, S. Sintonen, Thin Solid Films . 2013,第maya1期

机译：通过同步加速器X射线衍射形貌评估GaP衬底上GaP_（0.98）N_（0.02）层的临界厚度
3. Characterization of an Yb:LuVO4 single crystal using X-ray topography, high-resolution X-ray diffraction, and X-ray photoelectron spectroscopy [J] . W. Paszkowicz, P. Romanowski, J. Bak-Misiuk Radiation Physics and Chemistry . 2011,第10期

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4. THE EVALUATION OF QUARTZ RESONATORS VIA X-RAY DIFFRACTION TOPOGRAPHY [C] . K. G. Lipetzky, R. E. Green Jr., R. W. Armstrong, Annual Symposium on Quantitative Nondestructive Evaluation . 1999

机译：通过X射线衍射形貌评估石英谐振器
5. Evaluation of Particle Size Dependent Crystal Defects in Inconel 718 by Line Profile Analysis of X-Ray Diffraction [D] . Azersky, Colby. 2020

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6. Collection Efficiencies of High Flow Rate Personal Respirable Samplers When Measuring Arizona Road Dust and Analysis of Quartz by X-ray Diffraction [O] . Peter Stacey, Taekhee Lee, Andrew Thorpe, -1

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7. The Evaluation of Quartz Resonators Via X-Ray Diffraction Topography [O] . Lipetzky, K. G., Green, R. E., Jr., Armstrong, R. W., 1999

机译：通过X射线衍射形貌评估石英谐振器
8. Stroboscopic Topography of Quartz Resonators with Synchrotron Radiation [R] . Glueer, C. C., Graeff, W., Moeller, H. 1982

机译：具有同步辐射的石英谐振器的频闪地形

THE EVALUATION OF QUARTZ RESONATORS VIA X-RAY DIFFRACTION TOPOGRAPHY

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