ENHANCED TOPOGRAPHICAL CHARACTERIZATION OF SHARP STEP EDGES WITH SIMULTANEOUS AFM IMAGING AND FORCE SPECTROSCOPY

机译：同时进行AFM成像和力谱分析的锋利阶梯形边缘的增强形貌表征

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Topographical imaging with atomic force microscopy (AFM) has become an established method since its invention in 1986. However, there exist a variety of imaging artifacts that can distort the acquired images, especially when using sharp probes such as carbon nanotubes or nanowires. This paper briefly discusses common imaging artifacts occurring at sharp step edges and explores theoretically their mitigation with spectral and multi-frequency methods that can perform simultaneous topographical imaging and force spectroscopy. The work focuses on the spectral inversion method, which has been experimentally validated by others [Stark et al., Proc. Natl. Acad. Sci. USA 99, 8473-8478 (2002); Sahin et al., Nature Nanotech. 2, 507-514 (2007)], and on a recently proposed dual-frequency-modulation method, which has been demonstrated within computational simulations and is under experimental implementation in our laboratory [Solares & Chawla, Meas. Sci. & Technol. 19, No. 055502; Chawla & Solares, Meas. Sci. &Technol. 20, No. 015501].

机译：自1986年发明以来，采用原子力显微镜（AFM）进行地形成像已成为一种既定方法。但是，存在多种成像伪影，这些伪影会扭曲所采集的图像，尤其是在使用诸如碳纳米管或纳米线之类的尖锐探针时。本文简要讨论了出现在尖锐台阶边缘的常见成像伪影，并从理论上探讨了可以同时进行地形成像和力谱分析的频谱和多频方法的缓解方法。这项工作着重于频谱反演方法，该方法已被其他人[Stark等人，Proc.Natl.Acad.Sci.USA，89：3587-3877]实验验证。 Natl。学院科学美国99，8473-8478（2002）; Sahin等人，Nature Nanotech。 2，507-514（2007）]，以及最近提出的双频调制方法，该方法已在计算仿真中得到了证明，并且正在我们实验室的实验实施中[Solares＆Chawla，Meas。科学和技术。 19，编号055502； Chawla＆Solares，Meas。科学和技术。 20，编号015501]。

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《ASME international design engineering technical conferences and computers and information in engineering conference 2010》|2010年|p.461-467|共7页
会议地点 Montreal(CA);Montreal(CA);Montreal(CA);Montreal(CA);Montreal(CA);Montreal(CA)
作者
Santiago D. Solares;
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Assistant ProfessorrnUniversity of Maryland at College ParkrnDepartment of Mechanical Engineeringrn2181 Glenn L. Martin HallrnCollege Park, MD 20742;

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正文语种 eng
中图分类工程设计;
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1. Exploration of AFM Imaging Artifacts Occurring at Sharp Surface Features When Using Short Carbon Nanotube Probes and Possible Mitigation With Real-Time Force Spectroscopy [J] . Santiago D. Solares, Gaurav Chawla Journal of manufacturing science and engineering: Transactions of the ASME . 2010,第3期

机译：探索使用短碳纳米管探针时在锋利的表面特征上发生的AFM成像伪像以及实时力谱法可能的缓解方法
2. Nanoscale Structural Characterization of Individual Viral Particles Using Atomic Force Microscopy Infrared Spectroscopy (AFM-IR) and Tip-Enhanced Raman Spectroscopy (TERS) [J] . Dou Tianyi, Li Zhandong, Zhang Junjie, Analytical chemistry . 2020,第16期

机译：使用原子力显微镜红外光谱（AFM-IR）和尖端增强拉曼光谱（TERS）个体病毒颗粒的纳米级结构表征
3. Simultaneous Surface-Enhanced Raman Spectroscopy (SERS) and Atomic Force Microscopy (AFM) for Label-Free Physicochemical Analysis of Lipid Bilayers [J] . CLAIRE S. SWEETENHAM, MARTA LARRAONA-PUY, IOAN NOTINGHER Applied Spectroscopy: Society for Applied Spectroscopy . 2011,第12期

机译：同时表面增强拉曼光谱（SERS）和原子力显微镜（AFM）用于脂质双层的无标记物化分析
4. ENHANCED TOPOGRAPHICAL CHARACTERIZATION OF SHARP STEP EDGES WITH SIMULTANEOUS AFM IMAGING AND FORCE SPECTROSCOPY [C] . Santiago D. Solares International Design Engineering Technical Conferences . 2010

机译：通过同时AFM成像和力光谱增强夏普边缘的地形表征
5. Characterization of silicon surfaces by ellipsometry, atomic force microscopy (AFM), and auger electron spectroscopy (AES). [D] . Fang, Sung-Jen. 1996

机译：通过椭偏仪，原子力显微镜（AFM）和俄歇电子能谱（AES）表征硅表面。
6. Simultaneous detection of near-field topographic and fluorescence images of human chromosomes via scanning near-field optical/atomic-force microscopy (SNOAM). [O] . S Iwabuchi, H Muramatsu, N Chiba, 1997

机译：通过扫描近场光学/原子力显微镜（SNOAM）同时检测人类染色体的近场地形图和荧光图像。
7. Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes [O] . Özer H.O., Atabak M., Ellialtǧlu R.M., 2002

机译：振荡幅度小的Si（1 0 0）（2×1）的同时非接触原子力显微镜（nc-AFM）/ STM成像和力谱
8. THE EFFECT OF GROOVE-EDGE SHARPNESS IN RAYLEIGH STEP-BEARINGS (COMPRESSIBLE FLOW). [R] . trevorrow, e. u. 1970

机译：瑞利阶梯轴承（可压缩流动）中沟槽边缘锐度的影响。

ENHANCED TOPOGRAPHICAL CHARACTERIZATION OF SHARP STEP EDGES WITH SIMULTANEOUS AFM IMAGING AND FORCE SPECTROSCOPY

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