首页> 外文会议>Bulk metallic glasses >Fast X-ray Measurement System for Structural Study in Zr sub 60AL sub 15Ni sub 25 Supercooled Liquid
【24h】

Fast X-ray Measurement System for Structural Study in Zr sub 60AL sub 15Ni sub 25 Supercooled Liquid

机译:Zr sub 60AL sub 15Ni sub 25过冷液体中用于结构研究的快速X射线测量系统

获取原文
获取原文并翻译 | 示例

摘要

A fast x-ray measurement system adopting he geometry fo the debye-scherrer camera in combination with an imaging plate has been developed for the structural study of supercooled liquid. We carried out the anomalous x-ray scattering measurement as well as the ordinary x-ray diffraction measurement iwth this system in Zr sub 60Al sub 15Ni sub 25 supercooled liquid at 720K above the glass transition temperature. A whole diffraction profile of very good counting staitistics that even fits to the AXS analyses is obtained for a very short time. The analyses of scattering data obsreved in the Zr sub 60Al sub 15Ni sub 25 supercooled liquid for various annealing times in this system provide us information on a change of local atomic structures in the liquid state.
机译:已经开发了一种快速的X射线测量系统,该系统采用了德比-谢勒照相机的几何形状并结合成像板,用于过冷液体的结构研究。在该系统中,在高于玻璃化转变温度720K的Zr sub 60Al sub 15Ni sub 25过冷液体中,我们执行了异常X射线散射测量以及常规X射线衍射测量。在很短的时间内就可以得到非常好的计数统计量的整个衍射图谱,甚至适合AXS分析。在该系统中,对于退火时间不同的Zr sub 60Al sub 15Ni sub 25过冷液体中弥散的散射数据的分析为我们提供了有关液态局部原子结构变化的信息。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号