Abstract: The surface charge method (SCM) is an accurate electric field solver based on the numerical integration of the charge distribution on the electrode surface. The method is suitable for the field analysis of an electron gun and lens with complicated geometry, but it becomes the most time-consuming part when electron rays are traced for the analysis of the electron optical characteristics of these devices. We have studied the SCM and the electron ray-tracing on vector pipeline supercomputers, the CRAY X-MP and the Fujitsu VP2600. On these computers, a big reduction of the computing time is obtained by the optimization of the SCM- code. This enables us to trace many electron rays for the electron beam analysis. Some applications of the optimized SCM-code for the beam analysis are also presented.!10
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