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首页> 外文会议>Conference on High-Power Diode Laser Technology and Applications II; 20040126-20040127; San Jose,CA; US >Diode array reliability experiment
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Diode array reliability experiment

机译：二极管阵列可靠性实验

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摘要

The reliability, long-term performance and lifetime of high power diode arrays are important issues for pumping of solid state and fiber laser systems. Operation of high power arrays in these systems has resulted in greater degradation rates than the reported lifetime data. We report on lifetime testing of a commercial high power array using an automated diode array reliability experiment. This computer controlled setup operates the laser array 24 hours a day in a cyclical format of 10 minutes on and one minute off. The array currently being tested was operated for more than 2500 hours at which time it experienced a sudden drop in power. Analysis of the array and the data suggest that the micro channel coolers corroded and that a sudden plugging of one or more channels caused the failure.
机译：高功率二极管阵列的可靠性，长期性能和使用寿命是泵浦固态和光纤激光器系统的重要问题。在这些系统中，高功率阵列的运行导致的退化率高于报告的寿命数据。我们报告了使用自动化二极管阵列可靠性实验的商用大功率阵列的寿命测试。此计算机控制的设置每天24小时以10分钟打开和1分钟关闭的循环格式操作激光阵列。当前正在测试的阵列运行了2500多个小时，此时功率突然下降。对阵列和数据的分析表明，微通道冷却器受到腐蚀，一个或多个通道的突然堵塞导致了故障。

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