首页> 外文会议>Conference on Integrated Optics: Devices, Materials, and Technologies Ⅵ Jan 21-23, 2002 San Jose, USA >Graded-index profile analysis from M-line, DNS and EDS measurements of glass waveguides produced by K~+/Ag~+ ion-exchange combinations
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Graded-index profile analysis from M-line, DNS and EDS measurements of glass waveguides produced by K~+/Ag~+ ion-exchange combinations

机译:由K〜+ / Ag〜+离子交换组合产生的玻璃波导的M线,DNS和EDS测量得出的折射率梯度分布分析

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Direct near-surface (DNS) and m-line techniques for the measurement of surface refractive index of ion-exchanged waveguides are compared. Measurements are also compared to direct investigation of ion concentration profiles by energy dispersion spectroscopy (EDS). Good agreement is obtained for the Ag~+, K~+, and Ag~++K~+ exchanged samples, but not for the K~++Ag~+ sample. The index profile approximately follows in a linear proportion the concentration profile after a single Ag~+-exchange, while this is not observed for all other samples involving K~+-exchange. These results on ion-exchange and refractive-index profiles are discussed, towards a comprehensive and accurate characterization of graded-index waveguides.
机译:比较了直接近表面(DNS)和m线技术测量离子交换波导的表面折射率。还将测量结果与通过能量色散谱(EDS)直接研究离子浓度分布进行比较。对于交换的Ag〜+,K〜+和Ag〜++ K〜+样品,取得了良好的一致性,但对于K〜++ Ag〜+样品,则没有良好的一致性。折射率分布大致按线性比例遵循一次Ag +交换后的浓度分布,而对于其他所有涉及K +交换的样品均未观察到。讨论了这些有关离子交换和折射率分布图的结果,旨在对梯度折射率波导进行全面而准确的表征。

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