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首页> 外文会议>Conference on Optical Design and Testing; 20071112-15; Beijing(CN) >Modulation transfer function measurement of charge-coupled devices using frequency-variable fringe patterns
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Modulation transfer function measurement of charge-coupled devices using frequency-variable fringe patterns

机译：使用频率可变条纹图案测量电荷耦合器件的调制传递函数

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摘要

Although there are various methods to measure the modulation transfer function (MTF) of charge-coupled devices (CCD), the interferometric fringe pattern method has advantages over others, such as canted slit sources, bar targets, knife-edge, laser-speckle patterns, random noise pattern, etc. Our interferometric method is relatively simple and versatile: It requires no critical optics and no focusing or precision alignment, the entry array is tested, the contrast ratio of the test pattern is high enough, the spatial frequency of the fringe pattern can vary continuously. Our method generates the formation of a sinusoidal intensity fringe pattern by the interference of two monochromatic plane waves, and straightforward projects it onto the CCD array under test. The construction of the experimental device is based on the Fresnel Double-Mirror structure. A 2.5 mw He-Ne laser with the wavelength of 632.8 nm is used as the light source, the laser beam is spatially filtered by a 10 μm pinhole and expanded to a diameter of 30 mm, and the resulting wave front is divided by two mirrors, which incline to each other at a small angle, and interfered. One of the mirrors is rotatable to vary the frequency of the pattern. The CCD array is mounted on a stage, which is also rotatable to make that the CCD array takes different angle with the fringe pattern direction, to receive the patterns. With the method we provided, the spatial frequency can be extended to some 2 times the Nyquist frequency of the CCD array to study the aliasing effect. In the Cartesian coordinates, the x- and y- axis MTFs (at angle 0° and 90°) of the CCD array were measured, the other three MTFs (at angle 26.56°, 45° and 63.44°), which nobody has done before, were also tested offering a more comprehensive characterization of the CCD array.
机译：尽管有多种方法可以测量电荷耦合器件（CCD）的调制传递函数（MTF），但干涉条纹图方法比其他方法具有优势，例如斜缝光源，条形靶，刀口，激光散斑图，随机噪声图案等。我们的干涉测量方法相对简单且用途广泛：它不需要关键的光学器件，不需要聚焦或精确对准，可以测试入口阵列，测试图案的对比度足够高，条纹图案可以连续变化。我们的方法通过两个单色平面波的干涉生成正弦强度条纹图案的形成，并将其直接投影到被测CCD阵列上。实验装置的构造基于菲涅耳双镜结构。使用波长为632.8 nm的2.5 mw He-Ne激光器作为光源，激光束通过10μm的针孔在空间上过滤，并扩展为直径30 mm，结果波前被两个反射镜分开，它们以小角度彼此倾斜，并且相互干扰。反射镜之一可旋转以改变图案的频率。 CCD阵列安装在平台上，该平台也可旋转以使CCD阵列与条纹图案方向成不同的角度，以接收图案。使用我们提供的方法，空间频率可以扩展到CCD阵列奈奎斯特频率的大约2倍，以研究混叠效应。在笛卡尔坐标中，测量了CCD阵列的x和y轴MTF（分别在0°和90°角处），其他三个MTF（分别在26.56°，45°和63.44°处）被测量，没有人做过之前，还进行了测试，以提供CCD阵列的更全面的特性。

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