首页> 外文会议>Conference on Quantum Sensing and Nanophotonic Devices; 20040125-20040129; San Jose,CA; US >Optoelectronic investigation of novel PbSrSe thin films for mid-infrared device applications
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Optoelectronic investigation of novel PbSrSe thin films for mid-infrared device applications

机译:用于中红外器件应用的新型PbSrSe薄膜的光电研究

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We review our recently combined study of temperature-dependent photoluminescence, absorption, and photocurrent measurements with theoretical models on PbSrSe thin films grown by molecular beam epitaxy for the key properties of PbSrSe thin films and their microstructures. The derived empirical equations for band gaps, effective masses, and refractive indices have been employed successfully in PbSrSe/PbSe multiple quantum well (MQW) mid-infrared laser systems, which opens the way for the design of Ⅳ-Ⅵ MQW mid-infrared lasers. The infrared detection of PbSrSe thin films has been demonstrated at different temperatures, where the spectral intensity and wavelength coverage are determined by the band gap and the film thickness. The bias- and frequency-dependent capacitance characteristics have also been investigated in detail.
机译:我们回顾了我们最近对结合温度依赖性光致发光,吸收和光电流测量的研究与分子束外延生长的PbSrSe薄膜的理论模型有关PbSrSe薄膜及其微结构的关键特性。在PbSrSe / PbSe多量子阱(MQW)中红外激光系统中成功地采用了带隙,有效质量和折射率的经验公式,这为设计Ⅳ-ⅥMQW中红外激光器开辟了道路。 。已经证明了在不同温度下PbSrSe薄膜的红外检测,其中光谱强度和波长覆盖范围由带隙和膜厚决定。还详细研究了与偏置和频率相关的电容特性。

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