• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文会议>Conference on Sensors and Their Applications; 20030902-20030904; Limerick; IE >Design for Testability Considerations For High Performance Analogue to Digital Converters
【24h】

Design for Testability Considerations For High Performance Analogue to Digital Converters

机译：高性能模数转换器的可测试性考虑因素设计

获取原文
获取原文并翻译 | 示例
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

In many instrumentation systems, an analogue signal is to be acquired and processed, with the signal processing commonly performed in the digital domain. The conversion process between the analogue and digital relies on high performance Analogue to Digital Converters (ADCs). In order to assess whether the ADC is operating as to the required design specification, suitable test methods are required. Testing an ADC is non-trivial, and with ever increasing performance requirements, the test needs are increasing in complexity. This paper will discuss requirements for the testing of ADCs, in particular relating to production test, and will review a range of test techniques and Built-in Self-Test (BIST) approaches for Integrated Converters.
机译：在许多仪器系统中，将采集和处理模拟信号，通常在数字域中执行信号处理。模拟和数字之间的转换过程取决于高性能的模数转换器（ADC）。为了评估ADC是否按照要求的设计规范运行，需要合适的测试方法。测试ADC并非易事，并且随着性能要求的不断提高，测试需求的复杂性也在不断提高。本文将讨论ADC测试的要求，特别是与生产测试有关的要求，并将回顾一系列测试技术和集成转换器的内置自测试（BIST）方法。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号