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首页> 外文会议>Conference on Smart Materials II, Dec 16-18, 2002, Melbourne, Australia >Nano-scale spatially resolved simultaneous measurement of in-plane and out-of-plane force components on surfaces - A novel operational mode in Atomic Force Microscopy
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Nano-scale spatially resolved simultaneous measurement of in-plane and out-of-plane force components on surfaces - A novel operational mode in Atomic Force Microscopy

机译：纳米级空间分辨的表面上平面内和平面外力分量的同时测量-原子力显微镜中的新型操作模式

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摘要

The atomic force microscope (AFM) allows investigation of the properties of surfaces and interfaces at atomic scale resolution. However, several different operational modes, (imaging, force versus distance and lateral force modes), need to be deployed in order to gain insight into the structure, tribological and mechanical properties. A new method, based on a variation of the force versus distance mode, has been developed. In essence, a coupling of the deformational modes of the probe is exploited whereby the tip is induced to undergo lateral travel in response to application of an out-of-plane force (and thus normal bending of the force-sensing lever). The lateral travel induces in-plane forces that are then measurable as a consequence of stimulation of the 'buckling' deformational mode of the lever. Due to the lever geometry, the technique offers an increase in resolution of an order of magnitude over existing AFM methods for measurement of atomic scale stick-slip events. In addition, the method allows measurement of the lateral deformation of the sample as well as scanner calibration. Outcomes will be demonstrated for atomically flat surfaces such as WTe_2 and highly oriented pyrolytic graphite.
机译：原子力显微镜（AFM）可以原子级分辨率研究表面和界面的特性。但是，需要部署几种不同的操作模式（成像，力对距离和横向力模式），以便深入了解结构，摩擦学和机械性能。已经开发了一种基于力与距离模式的变化的新方法。实质上，利用了探针的变形模式的耦合，从而响应于施加平面外力（以及因此力感测杆的正常弯曲）而使尖端受到横向移动。横向行进会产生平面内力，由于刺激杠杆的“屈曲”变形模式，平面内力随后可测量。由于杠杆的几何形状，该技术的分辨率比现有的AFM测量原子级粘滑事件的方法提高了一个数量级。另外，该方法允许测量样品的横向变形以及扫描仪校准。结果将证明在原子上平坦的表面，例如WTe_2和高度取向的热解石墨。

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