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首页> 外文会议>Conference on Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII Apr 21-22, 2003 Orlando, Florida, USA >Radiometrically calibrating spectrally coupled 2-color projectors
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Radiometrically calibrating spectrally coupled 2-color projectors

机译：辐射校准光谱耦合的2色投影仪

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摘要

Infrared projection systems based on resistor arrays typically produce radiometric outputs with wavelengths that range from less than 3 microns to more than 12 microns. This makes it possible to test infrared sensors with spectral responsivity anywhere in this range. Two resistor-array projectors optically folded together can stimulate the two bands of a 2-color sensor. If the wavebands of the sensor are separated well enough, it is possible to fold the projected images together with a dichroic beam combiner (perhaps also using spectral filters in front of each resistor array) so that each resistor array independently stimulates one band of the sensor. If the wavebands are independently stimulated, it is simple to perform radiometric calibrations of both projector wavebands. In some sensors, the wavebands are strongly overlapping, and driving one of the resistor arrays stimulates both bands of the unit-under-test (UUT). This "coupling" of the two bands causes errors in the radiance levels measured by the sensor, if the projector bands are calibrated one at a time. If the coupling between the bands is known, it is possible to preprocess the driving images to effectively decouple the bands. This requires performing transformations, which read both driving images (one in each of the two bands) and judiciously adjusting both projectors to give the desired radiance in both bands. With this transformation included, the projection system acts as if the bands were decoupled ―varying one input radiance at a time only produces a change in the corresponding band of the sensor. This paper describes techniques that have been developed to perform radiometric calibrations of spectrally coupled, 2-color projector/sensor systems. Also presented in the paper are results of tests performed to demonstrate the performance of the calibration techniques. Possible hardware and algorithms for performing the transformation in real-time are also presented.
机译：基于电阻器阵列的红外投影系统通常会产生辐射输出，其波长范围从小于3微米到大于12微米。这使得可以在此范围内的任何地方测试具有光谱响应度的红外传感器。光学折叠在一起的两个电阻阵列投影仪可以刺激2色传感器的两个波段。如果传感器的波段分开得足够好，则可以用二向色合束器将投影图像折叠在一起（也许在每个电阻器阵列的前面也使用频谱滤波器），以便每个电阻器阵列独立地激发传感器的一个频带。如果波段是独立激发的，则对两个投影仪波段进行辐射度校准很简单。在某些传感器中，波段强烈重叠，并且驱动电阻器阵列之一会激发被测单元（UUT）的两个波段。如果一次校准一个投影仪波段，则两个波段的这种“耦合”会导致传感器测得的辐射水平出现误差。如果已知带之间的耦合，则可以预处理驱动图像以有效地使带解耦。这需要执行转换，读取两个驱动图像（两个波段中的每个波段），并明智地调整两个投影仪，以在两个波段中获得所需的辐射率。包含此转换后，投影系统的作用就好像这些频带是解耦的一样—一次改变一个输入辐射仅会导致传感器相应频带的变化。本文介绍了已开发的用于对光谱耦合的2色投影仪/传感器系统进行辐射校准的技术。本文还介绍了为证明校准技术的性能而进行的测试结果。还介绍了用于实时执行转换的可能硬件和算法。

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