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首页> 外文会议>Conference on Terahertz Photonics; 20071112-14; Beijing(CN) >A transmitted Terahertz-emission microscopy
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A transmitted Terahertz-emission microscopy

机译：透射太赫兹发射显微镜

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摘要

A novel transmitted terahertz-emission microscopy (TTEM) is proposed and developed for improving the spatial resolution of THz imaging. An epitaxial GaAs film grown on the GaP substrate was used as THz emitter; the transmitted THz signal was collected and detected by a ZnTe electric-optical crystal. Because the thick of GaAs layer is merely 1 um, the THz wave source has the same size of the excited point. While attaching a sample directly onto the emitter, the spatial resolution is decided by the diameter of focused pump beam, which can be achieved a few micrometers and tunable. In addition, it can avoid the loss of the spectral components. By means of the near-field detection, the intensity, spatial resolution and bandwidth of THz signal in this system can be enhanced further. The configuration and characteristics of this microscopy are described in detail.
机译：提出并开发了一种新型的透射太赫兹发射显微镜（TTEM），以提高太赫兹成像的空间分辨率。在GaP衬底上生长的外延GaAs膜用作THz发射极。传输的太赫兹信号被ZnTe电光晶体收集和检测。由于GaAs层的厚度仅为1 um，因此太赫兹波源的激发点大小相同。当将样品直接附着到发射器上时，空间分辨率取决于聚焦泵浦光束的直径，该直径可以达到几微米且可调。另外，它可以避免光谱成分的损失。通过近场检测，可以进一步提高系统中太赫兹信号的强度，空间分辨率和带宽。详细描述了这种显微镜的结构和特征。

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